Physics Electronics PMDC Conceptual Practice
PMDC Verified Question 49 of 494
When a reverse bias voltage across a \(\text{p-n}\) junction diode is increased beyond a critical threshold, a sudden sharp increase in reverse current occurs. In heavily doped \(\text{p-n}\) junctions with narrow depletion regions, this breakdown is primarily caused by:
A
Thermal runaway due to excessive forward majority carrier diffusion
B
Direct quantum mechanical tunneling of valence electrons due to an intense electric field (Zener effect)
C
Complete physical melting of the copper lead wires
D
Recombination of donor ions with metal contact atoms
Tap any option to test your recall and reveal the step-by-step Propolis autopsy.

Propolis Cognitive Error Autopsy

Official Correct Choice:
Option B: Direct quantum mechanical tunneling of valence electrons due to an intense electric field (Zener effect)
Concept:

In heavily doped diodes, the depletion layer is extremely narrow (\(< 10\text{ nm}\)). Even a moderate reverse voltage produces an electric field exceeding \(10^6\text{ V/m}\), which pulls valence electrons directly across the narrow bandgap into the conduction band via field ionization (Zener breakdown).

Formula:

$$E = \frac{V_r}{W} > 10^6\text{ V/m}$$

Solution:

  • Heavy doping produces a very thin depletion width \(W\).


  • A strong electric field \(E = V / W\) ruptures covalent bonds directly, allowing valence electrons to tunnel into the conduction band.


  • This field-emission process is known as Zener breakdown (typically occurring at \(V_z < 6\text{ V}\)).


Why other options are incorrect:

  • Option A: Forward diffusion is irrelevant under strong reverse bias.
  • Option C: Breakdown is a solid-state junction phenomenon, not lead-wire melting.
  • Option D: Donor ions are fixed in the semiconductor lattice and do not recombine with external contact atoms.

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