Concept:Transition capacitance arises from the fixed space-charge layer, whereas diffusion capacitance arises from minority carrier charge storage injected during forward conduction.
Formula:$$C_T = \frac{\varepsilon A}{W} \quad (\text{Reverse Bias}), \quad C_D = \frac{\tau I_f}{\eta V_T} \quad (\text{Forward Bias})$$
Solution:- In forward bias, large numbers of minority carriers are injected and stored near the junction boundaries, making diffusion capacitance \( C_D \) (proportional to \( I_f \)) dominant.
- In reverse bias, current is negligible, so \( C_D \approx 0 \). Concurrently, the widened depletion layer acts as a dielectric, making transition capacitance \( C_T \) dominant.
Why other options are incorrect:- Option A: The dominant regimes are inverted.
- Options B & C: Each capacitance mechanism depends on different physical processes that dominate under opposite biasing conditions.
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