Physics Electronics PMDC Conceptual Practice
PMDC Verified Question 134 of 494
What causes Avalanche breakdown in a reverse-biased PN junction diode?
A
Cumulative impact ionization caused by high-velocity minority carriers in lightly doped junctions
B
Direct field emission across an extremely narrow depletion layer
C
Electroluminescent photon emission during forward bias
D
Complete chemical dissociation of the semiconductor lattice
Tap any option to test your recall and reveal the step-by-step Propolis autopsy.

Propolis Cognitive Error Autopsy

Official Correct Choice:
Option A: Cumulative impact ionization caused by high-velocity minority carriers in lightly doped junctions
Concept:

Avalanche breakdown occurs in lightly doped junctions with wider depletion regions under high reverse voltages (typically \( > 6\text{ V} \)), where accelerated minority carriers gain enough kinetic energy to free bound electrons via impact ionization.

Formula:

$$\text{Carrier Multiplication: } M = \frac{1}{1 - \left(\frac{V_R}{V_{BR}}\right)^n}$$

Solution:

  • Thermally generated minority carriers are accelerated by the reverse electric field across the wide depletion layer.


  • These high-energy carriers collide with lattice atoms, breaking covalent bonds and freeing secondary electron-hole pairs.


  • These newly freed carriers are accelerated in turn, triggering a chain reaction (avalanche multiplication) that produces a large reverse current.


Why other options are incorrect:

  • Option B: Direct field emission characterizes Zener breakdown in heavily doped junctions.
  • Option C: Radiative recombination occurs in forward-biased LEDs, not reverse-biased avalanche breakdown.
  • Option D: Avalanche breakdown is an electronic impact process, not a chemical dissociation of the crystal lattice.

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